MAXXI 6 - Coating thickness analyser
Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.
With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.
Key features
Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability, outstanding product life expectancy and low cost of ownership
Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
Multi collimator optimizes flux generation, enhancing measurement throughput
Giant slotted chamber design with generous interior volume, ideal for standard and oversized samples
The USB connection allows operation using a standard computer without additional hardware or firmware
Made in Germany to the highest engineering standards
Robust design for long term reliability
Approved by PTB (Physikalisch Technische Bundesanstalt), ensures highest level of radiation safety